Prof. Guo Wei (Kuo Way), president of the City University of Hong Kong, started his visit to BIT on April 2.
In addition to his schedule talk with BIT President Prof. Hu Haiyan on issues of university management, educational policies and joint endeavors, Prof. Guo gave a lecture entitled Challenges Related to Reliability in Modern Electronics to teachers and graduate students of BIT Schools, including SME.
Trained as an Engineer, Prof. Guo stressed the importance of reliability of e-products, and condensed all the challenges confronting modern electronics into four major issues. His reasoning was all put in the background of China’s power car railway transport system, making his analyses easier to grasp.
Professor Guo, born in 1951, is a world-renowned engineer. He received his PhD degree in engineering in 1980 from Kansas State University and BS degree in nuclear engineering in 1972 from National Tsing-Hua University in Taiwan. Now he is elected an overseas member of the Chinese Academy of Engineering, among many other glories, including membership of the United States National Academies of Engineering, Academia Sinica in Taiwan and International Academy for Quality.
