題目：Degradation-based Reliability Modeling and Burn-in Optimization
主講人：Yuan Tao 博士（Ohio University, United States）
時(shí)間：2015年6月11日10:20
地點(diǎn)：中心教學(xué)樓1326
主講人簡(jiǎn)介：
Dr. Tao Yuan is an Associate Professor in Industrial and Systems Engineering at Ohio University. He received the B.E. degree in thermal engineering from Tsinghua University, Beijing, China; the M.S. degree in aerospace engineering, and the M.E. degree in industrial engineering from Texas A&M University, College Station. He received the Ph.D. degree in industrial engineering from the University of Tennessee, Knoxville. His research interests are mainly in reliability modeling, statistical reliability data analysis, and reliability testing and characterization for micro-/nano-electronics and emerging engineering materials.
內(nèi)容簡(jiǎn)介：
Degradation analysis has been an attractive approach to reliability assessment for highly reliable products. This presentation will discuss some case studies on degradation modeling and analysis. In the first case study, products exhibited multi-phase degradation patterns, and a change-point regression model was used to model the nonlinear degradation phenomenon. In the second case study, units came from a nonhomogeneous population, and a Gaussian mixture model was used to model the excessive unit-to-unit variability in degradation paths. Finally, a degradation-based burn-in optimization problem will be discussed.
（主辦：管理工程系）
