題 目：Challenges Related to Reliability in Modern Electronics
主講人：Way Kuo教授 香港城市大學
時 間：2010年4月2日 上午10：30-11：20
地 點：研究生樓102
主講人簡介：
Professor Way Kuo is President of City University of Hong Kong, commencing 14 May 2008. Before joining CityU, Professor Kuo was University Distinguished Professor and Dean of Engineering at the University of Tennessee (UT). Professor Kuo received his PhD degree in engineering in 1980 from Kansas State University and BS degree in nuclear engineering in 1972 from National Tsing-Hua University in Taiwan. He is elected a Foreign Member of the Chinese Academy of Engineering. He is also an elected member of the US National Academy of Engineering, Academia Sinica in Taiwan and International Academy for Quality. He is Fellow of the American Society for Quality (ASQ), Institute of Electrical and Electronics Engineers (IEEE), Institute for Operations Research and the Management Science (INFORMS), American Statistical Association (ASA), and Institute of Industrial Engineers (IIE). Professor Kuo is renowned for his work in designing and modelling reliability for electronics systems and products and is a recipient of the IEEE Reliability Society Lifetime Achievement Award. He holds honorary professorship titles at many Universities.
A co-author of six textbooks, he is also well respected for promoting the higher education with an emphasis on its relevance to societal needs and problem-driven research. He serves as Editor of IEEE Transactions on Reliability.
內容簡介：
To stay competitive, one needs to warranty and design reliability in the product and processes. Four challenges are the key topics that we address in this talk when deal with reliability problems in modern electronics.
